화학공학소재연구정보센터
Applied Surface Science, Vol.256, No.4, 962-964, 2009
Observation of internal-conversion electrons induced by inelastic nuclear resonant scattering
Measurements of the internal-conversion electron emission due to the inelastic nuclear resonant excitation are reported. Fe-57 thin films of 20 and 1.3 nm thickness were deposited on Si(1 1 1), and the internal-conversion electrons were measured as a function of the photon energy. From the inelastic part of the spectra, the phonon density of states was obtained. Whereas the phonon density of states of 20-nm thick film resembles that of bulk alpha-Fe, the 1.3-nm thick film revealed an obvious softening of the acoustic mode. (C) 2009 Elsevier B.V. All rights reserved.