화학공학소재연구정보센터
Applied Surface Science, Vol.255, No.5, 3466-3469, 2008
Growth and properties of BiFeO3 thin films deposited on LaNiO3-buffered SrTiO3(001) and (111) substrates by PLD
BiFeO3 (BFO) films have been epitaxially grown on SrTiO3(0 0 1) and SrTiO3(1 1 1) substrates with a LaNiO3 conductive layer as a template using pulsed laser deposition. X-ray diffraction theta-2 theta and Phi scanning revealed that the epitaxial relationship is BFO[1 0 0]//LNO[1 0 0]//STO[1 0 0]; BFO(0 0 1)// LNO(0 0 1)//STO(0 0 1) and BFO [1 1 (2) over bar]//LNO[1 1 (2) over bar]//STO[1 1 (2) over bar]; BFO(1 1 1)//LNO(1 1 1)//STO(1 1 1) on SrTiO3(0 0 1) and SrTiO3(1 1 1) substrates, respectively. The epitaxial relationship was also confirmed by ex situ reflective high-energy electron reflection (RHEED). From P-E measurements, both samples showed typical ferroelectric hysteresis loops, indicating good electrical properties. Furthermore, it was found that the remanent polarization (2P(r)) under the same applied electrical field of the epitaxial BFO(1 1 1) thin film on the LNO-coated (1 1 1) STO substrate is much larger than that of the BFO(1 0 0) film on the LNO-coated STO(1 0 0) substrate. The larger polarization of BFO(1 1 1) films may be caused by that the easy polarization axis lays close to [1 1 1] direction, indicating the anisotropic ferroelectric property for BFO films. Thus, with the epitaxial LNO electrode template layers, the epitaxial BFO films exhibit high-quality structure and good electrical properties. (C) 2008 Elsevier B. V. All rights reserved.