화학공학소재연구정보센터
Advanced Materials, Vol.20, No.3, 528-528, 2008
Imaging the interfaces of conjugated polymer optoelectronic devices
A focused ion beam is used to extract cross-sectional samples from multilayer conjugated polymer films and optoelectronic devices. Subsequent TEM, AFM and SIMS studies yield insight into polymer-polymer and polymer-electrode interfaces and how these interfaces can be controlled by processing conditions, such as choice of solvent and thermal annealing.