화학공학소재연구정보센터
Advanced Functional Materials, Vol.14, No.6, 610-614, 2004
The first template-free growth of crystalline silicon microtubes
A simple template-free high-temperature evaporation method was developed for the growth of crystalline Si microtubes for the first time. As-grown Si microtubes were characterised using X-ray diffraction, scanning electron microscopy, transmission electron microscopy, and room-temperature photoluminescence. The lengths of the Si tubes can reach several hundreds of micrometers; some of them have lengths on the order of millimeters. Each tube has a uniform outer diameter along its entire length, and the typical outer diameter is approximate to 2-3 mum. Most of the tubes have a wall thickness of approximate to 400-500 nm, though a considerable number of them exhibit a very thin wall thickness of approximate to 50 nm. Room-temperature photoluminescence measurement shows the as-synthesized Si microtubes have two strong emission peaks centered at approximate to 589 nm and approximate to 617 nm and a weak emission peak centered at approximate to 455 nm. A possible mechanism for the formation of these Si tubes is proposed. We believe that the present discovery of the crystalline Si microtubes will promote further experimental studies on their physical properties and smart applications.