화학공학소재연구정보센터
Applied Surface Science, Vol.253, No.2, 810-813, 2006
Ion beam induced crystal-edge nanoclusters at the origin of poly(ethylene glycol) film stabilization
PEG films stabilized by noble gas ion beam irradiation showed characteristic clustering at the crystal edges. These structures appear in determined ion beam conditions after exposure to Ar and Kr ions. Atomic force microscopy exploration indicates that, rather than presenting drastic topographic features, the nanostructures show radically different elastic properties. Within the concerned set of ion beam conditions, the surface properties are observed to vary according to the absorbed energy as suggested by X-ray photoelectron spectroscopy and contact angle measurements. These analyses predict that Ar irradiation in the 500-600 V extraction potential range is an appropriate condition for PEG stabilization. (c) 2006 Elsevier B.V. All rights reserved.