화학공학소재연구정보센터
Applied Surface Science, Vol.157, No.4, 361-366, 2000
Frequency shift and energy dissipation in non-contact atomic-force microscopy
Frequency shift as a function of tip-surface distance is investigated theoretically for a real experimental condition on Si(lll) surface with a Si tip. Some different situations for the energy dissipation are considered: (1) without any energy dissipation; (2) with the energy dissipation of a constant e-value of the cantilever system; (3) with the energy dissipation from the tip-induced relaxation besides that of (2), which is addressed approximately by a coupled-two-vibrator model. It is shown that the energy dissipation effect in (2) is negligible and the results from (1) and (2) are almost the same even for rather low e-value(greater than or equal to 1000). The situation (3) is indicated to be the one which can affect the frequency shift remarkably for small tip-surface distance.