화학공학소재연구정보센터
Thin Solid Films, Vol.515, No.14, 5568-5573, 2007
Phase retrieval from diffraction data utilizing pre-determined partial infon-nation
We developed a phase retrieval algorithm that utilizes pre-determined partial phase information to overcome insufficient oversampling ratio in diffraction data. Implementing the Fourier modulus projection and the modified support projection manifesting the pre-determined information, a generalized difference map and HIO (Hybrid Input-Output) algorithms are developed. Optical laser diffraction data as well as simulated X-ray diffraction data are used to illustrate the validity of the proposed algorithm, which revealed the strength and the limitations of the algorithm. The proposed algorithm can expand the applicability of the diffraction based image reconstruction. (c) 2006 Elsevier B.V. All rights reserved.