화학공학소재연구정보센터
Thin Solid Films, Vol.458, No.1-2, 223-226, 2004
Infrared optical properties of sol-gel Pb1-xLaxTiO3 ferroelectric thin films
The Pb1-xLaxTiO3 (PLT) ferroelectric thin films on Pt/Ti/SiO2/Si(1 0 0) substrates were fabricated by a sol-gel process. The infrared optical properties of PLT thin films with x = 0.1, 0.2, 0.25 on platinized silicon Pt(1 1 1)/Ti/SiO2/Si(1 0 0) substrates were studied by infrared spectroscopic ellipsometry (IRSE) technique in the wavelength region from 2.5 to 12.6 mum. The infrared optical constants were obtained by fitting the IRSE data using a classical dielectric function model. The refractive index increases, and the extinction coefficient decreases as wavenumber increases in the measured infrared region. The refractive index of PLT thin films decreases as the La contents increase in the films. (C) 2003 Elsevier B.V. All rights reserved.