Chemistry Letters, Vol.48, No.6, 513-516, 2019
Simulation of Conductive Atomic Force Microscopy of Organic Photovoltaics by Dynamic Monte Carlo Method
Morphology is one of key factors to improve performance of organic photovoltaics, and further understanding is required. Conductive atomic force microscopy, C-AFM, is an experimental technique that can reveal morphologies in high resolution, but provides three-dimensional information with difficulty. In this study, dynamic Monte Carlo method is employed to simulate C-AFM of morphologies, which agrees with experiments. Simulation will help to predict three-dimensional morphologies from experimental data.