화학공학소재연구정보센터
Applied Surface Science, Vol.354, 229-234, 2015
Tight-binding parameters of graphite determined with angle-resolved photoemission spectra
An exfoliated Kish graphite sample on a heavily n-doped Si substrate covered with native oxide was prepared with a conventional micromechanical cleavage method. From angle-resolved photoemission spectra (ARPES), we measured the band structure of graphite over photon energies from 28 eV to 116 eV. The inner potential V-0 = 17.25 eV is determined with a period from the band dispersion in the KH direction. A set of parameters in the tight-binding method and the SWMcC model for graphite is extracted from the fitted results. A comparison of constant-energy mapping results at large binding energy indicates the reliability of the tight-binding parameters extracted from the ARPES results. (C) 2014 Elsevier B.V. All rights reserved.