화학공학소재연구정보센터
Applied Surface Science, Vol.363, 225-228, 2016
Segregation anisotropy of Sn on different crystallographic orientation surfaces of coarse-grained Zircaloy-4
X-ray photoelectron spectroscopy (XPS) technique was utilized to study the correlation between the tendency of Sn surface segregation and the crystallographic orientation of grain surface in coarse-grained (0.2-0.8 mm in diameter) Zircaloy-4 specimen. The results indicated that the intensity of Sn surface segregation was in an order of (0001) < (<(1)over bar>2 (1) over bar0) approximate to (01 (1) over bar0), and it was in agreement with the prediction from bond-breaking theory. (C) 2015 Elsevier B.V. All rights reserved.