화학공학소재연구정보센터
Materials Science Forum, Vol.445-6, 355-357, 2004
The microstructure of EPOXY-layered silicate nanocomposite studied by positron annihilation
A series of epoxy-rectorite nanocomposites with rectorite content Phi(w) ranged from 0 to 2.0wt% were prepared and the sample with Phi(w)=0.5% exhibits high mechanical performance and thermal stability. XRD, TEM and positron annihilation lifetime (PAL) were used to study the microstructure of materials under study. The exfoliation of rectorite platelets in epoxy matrix was observed by XRD patterns and TEM micrograph. The PAL results show that the interfacial layers between silicate layers and polymer were formed and play an important role for improvement of material performance.