화학공학소재연구정보센터
Materials Science Forum, Vol.426-4, 4531-4534, 2003
Portable X-ray apparatus for stress measurements
Portable apparatus presented in this paper is an x-ray equipment permitting to carry out traditional stress determination by x-ray diffraction method both in-laboratory and in-field conditions. The portability of apparatus is achieved by construction of compact and light high voltage source coupled with special x-ray tube and using of coordinate sensitive detector. Other distinctive characteristic of apparatus is an absence of goniometer. Simple device to measure incidence angle of x-ray beam substituting a goniometer permits to carry out the stress measurements of different industrial equipments such as pipelines, tanks. Software program executes a control of measurement procedure and carries out a data processing experimental results.