951 |
Photoelectrical characteristics of metal-insulator-semiconductor structures based on graded-gap HgCdTe grown by molecular-beam epitaxy Voitsekhovskii AV, Nesmelov SN, Dzyadukh SM Thin Solid Films, 551, 92, 2014 |
952 |
Calculation of dispersion of surface and interface phonon polariton resonances in wurtzite semiconductor multilayer system taking damping effects into account Lee SC, Ng SS, Abu Hassan H, Hassan Z, Dumelow T Thin Solid Films, 551, 114, 2014 |
953 |
Amorphous Y-Ba-Cu-O oxide thin films: Structural, electrical and dielectric properties correlated with uncooled infrared pyroelectric detection performances Degardin AF, Galiano X, Gensbittel A, Dubrunfaut O, Jagtap VS, Kreisler AJ Thin Solid Films, 553, 104, 2014 |
954 |
[1] Benzothieno[3,2-b][1] benzothiophenes- and dinaphtho[2,3-b: 2', 3'-f] thieno[3,2-b] thiophene-based organic semiconductors for stable, high-performance organic thin-film transistor materials Takimiya K, Yamamoto T, Ebata H, Izawa T Thin Solid Films, 554, 13, 2014 |
955 |
Materials and devices with applications in high-end organic transistors Takeya J, Uemura T, Sakai K, Okada Y Thin Solid Films, 554, 19, 2014 |
956 |
Monodomain planar alignment of 1,4,8,11,15,18,22, 25-octahexylphthalocyanine by melt growth method Yamasaki N, Saito T, Kim J, Yoshida H, Fujii A, Shimizu Y, Ozaki M Thin Solid Films, 554, 99, 2014 |
957 |
Photoelectron spectroscopic study on band alignment of poly(3-hexylthiophene-2,5-diyl)/polar-ZnO heterointerface Nagata T, Oh S, Yamashita Y, Yoshikawa H, Ikeno N, Kobayashi K, Chikyow T, Wakayama Y Thin Solid Films, 554, 194, 2014 |
958 |
Impedance spectroscopy for high resolution measurements of energetic distributions of localized states in organic semiconductors Hase H, Okachi T, Ishihara S, Nagase T, Kobayashi T, Naito H Thin Solid Films, 554, 218, 2014 |
959 |
Density-functional theory study of stability and subgap states of crystalline and amorphous Zn-Sn-O Korner W, Elsasser C Thin Solid Films, 555, 81, 2014 |
960 |
Optical absorption spectra of P-type Tin monoxide thin films around their indirect fundamental gaps determined using photothermal deflection spectroscopy Toyama T, Seo Y, Konishi T, Okamoto H, Morimoto R, Nishikawa Y, Tsutsumi Y Thin Solid Films, 555, 148, 2014 |