화학공학소재연구정보센터
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No. Article
951 Photoelectrical characteristics of metal-insulator-semiconductor structures based on graded-gap HgCdTe grown by molecular-beam epitaxy
Voitsekhovskii AV, Nesmelov SN, Dzyadukh SM
Thin Solid Films, 551, 92, 2014
952 Calculation of dispersion of surface and interface phonon polariton resonances in wurtzite semiconductor multilayer system taking damping effects into account
Lee SC, Ng SS, Abu Hassan H, Hassan Z, Dumelow T
Thin Solid Films, 551, 114, 2014
953 Amorphous Y-Ba-Cu-O oxide thin films: Structural, electrical and dielectric properties correlated with uncooled infrared pyroelectric detection performances
Degardin AF, Galiano X, Gensbittel A, Dubrunfaut O, Jagtap VS, Kreisler AJ
Thin Solid Films, 553, 104, 2014
954 [1] Benzothieno[3,2-b][1] benzothiophenes- and dinaphtho[2,3-b: 2', 3'-f] thieno[3,2-b] thiophene-based organic semiconductors for stable, high-performance organic thin-film transistor materials
Takimiya K, Yamamoto T, Ebata H, Izawa T
Thin Solid Films, 554, 13, 2014
955 Materials and devices with applications in high-end organic transistors
Takeya J, Uemura T, Sakai K, Okada Y
Thin Solid Films, 554, 19, 2014
956 Monodomain planar alignment of 1,4,8,11,15,18,22, 25-octahexylphthalocyanine by melt growth method
Yamasaki N, Saito T, Kim J, Yoshida H, Fujii A, Shimizu Y, Ozaki M
Thin Solid Films, 554, 99, 2014
957 Photoelectron spectroscopic study on band alignment of poly(3-hexylthiophene-2,5-diyl)/polar-ZnO heterointerface
Nagata T, Oh S, Yamashita Y, Yoshikawa H, Ikeno N, Kobayashi K, Chikyow T, Wakayama Y
Thin Solid Films, 554, 194, 2014
958 Impedance spectroscopy for high resolution measurements of energetic distributions of localized states in organic semiconductors
Hase H, Okachi T, Ishihara S, Nagase T, Kobayashi T, Naito H
Thin Solid Films, 554, 218, 2014
959 Density-functional theory study of stability and subgap states of crystalline and amorphous Zn-Sn-O
Korner W, Elsasser C
Thin Solid Films, 555, 81, 2014
960 Optical absorption spectra of P-type Tin monoxide thin films around their indirect fundamental gaps determined using photothermal deflection spectroscopy
Toyama T, Seo Y, Konishi T, Okamoto H, Morimoto R, Nishikawa Y, Tsutsumi Y
Thin Solid Films, 555, 148, 2014