951 |
Measuring flow functions with the Flexible Wall Biaxial Tester Janssen RJM, Verwijs MJ, Scarlett B Powder Technology, 158(1-3), 34, 2005 |
952 |
Anisotropy of the ionic conductivity in potassium bismuth/rare earth molybdate crystals Trnovcova V, Skubla A, Schultze D Solid State Ionics, 176(19-22), 1739, 2005 |
953 |
Anisotropic magnetoresistance in La0.67Ca0.33MnO3/YBa2Cu4O8/La0.67Ca0.33MnO3 trilayer films Zhao K, Zhang L, Wong HK Thin Solid Films, 471(1-2), 287, 2005 |
954 |
Mobility anisotropy in Langmuir-Blodgett deposited poly(3-methoxypentyl-tiophene)-based thin film transistors Natali D, Sampietro M, Franco L, Bolognesi A, Botta C Thin Solid Films, 472(1-2), 238, 2005 |
955 |
On the AlAs/GaAs (001) interface dielectric anisotropy Hunderi O, Zettler JT, Haberland K Thin Solid Films, 472(1-2), 261, 2005 |
956 |
Electron backscattered diffraction analysis of copper damascene interconnect for ultralarge-scale integration Lee HJ, Kim DI, Ahn JH, Lee DN Thin Solid Films, 474(1-2), 250, 2005 |
957 |
On correlation of CdS and CdSe valence band parameters Horley PP, Gorley VV, Gorley PM, Gonzalez-Hernandez J, Vorobiev YV Thin Solid Films, 480, 373, 2005 |
958 |
Through-plane uniformity of optical anisotropy in spin-coated biphenyl dianhydride-p-phenylenediamine films Diao J, Hess DW Thin Solid Films, 483(1-2), 226, 2005 |
959 |
Simultaneous determination of the thickness and the dispersion of the dielectric constant of a Langmuir-Blodgett film deposited on a CaF2 plate Ikegami K Thin Solid Films, 483(1-2), 312, 2005 |
960 |
Influence of magnetic induced anisotropy on giant magnetoimpedance effects in FeCuNbSiB films Wang WJ, Xiao SQ, Jiang S, Yuan HM, Wu ZY, Ji G, Yan SS, Liu YH, Mei LM Thin Solid Films, 484(1-2), 299, 2005 |