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An Improved Method for Correcting Radiance Data for Bandpass Error Fairman HS Color Research and Application, 35(5), 328, 2010 |
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Mechano-chemical AFM nanolithography of metallic thin films: A statistical analysis Akhavan O, Abdolahad M Current Applied Physics, 10(4), 1203, 2010 |
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Quantification of compression wood severity in tracheids of Pinus radiata D. Don using confocal fluorescence imaging and spectral deconvolution Donaldson L, Radotic K, Kalauzi A, Djikanovic D, Jeremic M Journal of Structural Biology, 169(1), 106, 2010 |
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