화학공학소재연구정보센터
검색결과 : 140건
No. Article
81 Lattice relaxation and dislocation generation/annihilation in SiGe-on-insulator layers during Ge condensation process
Tezuka T, Moriyama Y, Nakaharai S, Sugiyama N, Hirashita N, Toyoda E, Miyamura Y, Takagi S
Thin Solid Films, 508(1-2), 251, 2006
82 Thin-body Ge-on-insulator p-channel MOSFETs with Pt germanide metal source/drain
Maeda T, Ikeda K, Nakaharai S, Tezuka T, Sugiyama N, Moriyama Y, Takagi S
Thin Solid Films, 508(1-2), 346, 2006
83 Optically transparent thin film of layered niobate (K4Nb6O17) intercalated with tris(2,2'-bipyridyl)ruthenium(II)
Tong ZW, Takagi S, Tachibana H, Takagi K, Inoue H
Chemistry Letters, 34(4), 608, 2005
84 Preparation and characterization of a transparent thin film of the layered perovskite, K2La2Ti3O10, intercalated with an ionic porphyrin
Tong ZW, Zhang GZ, Takagi S, Shimada T, Tachibana H, Inoue H
Chemistry Letters, 34(5), 632, 2005
85 Intercalation of tris(2,2'-bipyridine)ruthenium(II) into a layered perovskite derived from aurivillius phase Bi2SrTa2O9
Tong ZW, Takagi S, Shimada T, Tachibana H, Inoue H
Chemistry Letters, 34(10), 1406, 2005
86 Airtight butyl rubber under high pressures in the storage tank of CAES-G/T system power plant
Terashita F, Takagi S, Kohjiya S, Naito Y
Journal of Applied Polymer Science, 95(1), 173, 2005
87 Novel soft chemical method for optically transparent Ru(bpy)(3)-K4Nb6O17 thin film
Tong ZW, Takagi S, Tachibana H, Takagi K, Inoue H
Journal of Physical Chemistry B, 109(46), 21612, 2005
88 Topography simulations for contact formation involving reactive ion etching, sputtering and chemical vapor deposition
Takagi S, Onoue S, Iyanagi K, Nishitani K, Shinmura T
Journal of Vacuum Science & Technology B, 23(3), 1076, 2005
89 Sub-band structure engineering for advanced CMOS channels
Takagi S, Mizuno T, Tezuka T, Sugiyama N, Nakaharai S, Numata T, Koga J, Uchida K
Solid-State Electronics, 49(5), 684, 2005
90 Strain relaxation of strained-Si layers on SiGe-on-insulator (SGOI) structures after mesa isolation
Usuda K, Mizuno T, Tezuka T, Sugiyama N, Moriyama Y, Nakaharai S, Takagi S
Applied Surface Science, 224(1-4), 113, 2004