화학공학소재연구정보센터
검색결과 : 275건
No. Article
81 Paraffin wax passivation layer improvements in electrical characteristics of bottom gate amorphous indium-gallium-zinc oxide thin-film transistors
Chang GW, Chang TC, Syu YE, Tsai TM, Chang KC, Tu CH, Jian FY, Hung YC, Tai YH
Thin Solid Films, 520(5), 1608, 2011
82 Resistive switching characteristics of ytterbium oxide thin film for nonvolatile memory application
Tseng HC, Chang TC, Huang JJ, Chen YT, Yang PC, Huang HC, Gan DS, Ho NJ, Sze SM, Tsai MJ
Thin Solid Films, 520(5), 1656, 2011
83 High Density Ni Nanocrystals Formed by Coevaporating Ni and SiO2 Pellets for the Nonvolatile Memory Device Application
Hu CW, Chang TC, Tu CH, Huang YH, Lin CC, Chen MC, Huang FS, Sze SM, Tseng TY
Electrochemical and Solid State Letters, 13(3), H49, 2010
84 Unusual Threshold Voltage Shift Caused by Self-Heating-Induced Charge Trapping Effect
Jian FY, Chang TC, Chu AK, Chen TC, Chen SC, Lin CS, Li HW, Lee MH, Chen JS, Shih CC
Electrochemical and Solid State Letters, 13(4), H95, 2010
85 A 2 Bit Nonvolatile Memory Device with a Transistor Switch Function Accomplished with Edge-FN Tunneling Operation
Jian FY, Chang TC, Chu AK, Chen SC, Chen TC, Hsu YE, Tseng HC, Lin CS, Young TF, Yang YL
Electrochemical and Solid State Letters, 13(5), H166, 2010
86 Bipolar Resistive Switching Characteristics of Transparent Indium Gallium Zinc Oxide Resistive Random Access Memory
Chen MC, Chang TC, Huang SY, Chen SC, Hu CW, Tsai CT, Sze SM
Electrochemical and Solid State Letters, 13(6), II191, 2010
87 Preparation of a nonleaching, recoverable and recyclable palladium-complex catalyst for Heck coupling reactions by immobilization on Au nanoparticles
Young JN, Chang TC, Tsai SC, Yang L, Yu SJ
Journal of Catalysis, 272(2), 253, 2010
88 Asymmetric Negative Bias Temperature Instability Degradation of Poly-Si TFTs under Static Stress
Weng CF, Chang TC, Jian FY, Chen SC, Lu J, Lu IC
Journal of the Electrochemical Society, 157(1), H22, 2010
89 Degradation of Low Temperature Polycrystalline Silicon Thin Film Transistors under Negative Bias Temperature Instability Stress with Illumination Effect
Lin CS, Chen YC, Chang TC, Li HW, Hsu WC, Chen SC, Tai YH, Jian FY, Chen TC, Tu KJ, Wu HH, Chen YC
Journal of the Electrochemical Society, 157(2), J29, 2010
90 Nitric Acid Oxidation of Si for the Tunneling Oxide Application on CoSi2 Nanocrystals Nonvolatile Memory
Hu CW, Chang TC, Tu CH, Chen YD, Lin CC, Chen MC, Lin JY, Sze SM, Tseng TY
Journal of the Electrochemical Society, 157(3), H332, 2010