검색결과 : 275건
No. | Article |
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81 |
Paraffin wax passivation layer improvements in electrical characteristics of bottom gate amorphous indium-gallium-zinc oxide thin-film transistors Chang GW, Chang TC, Syu YE, Tsai TM, Chang KC, Tu CH, Jian FY, Hung YC, Tai YH Thin Solid Films, 520(5), 1608, 2011 |
82 |
Resistive switching characteristics of ytterbium oxide thin film for nonvolatile memory application Tseng HC, Chang TC, Huang JJ, Chen YT, Yang PC, Huang HC, Gan DS, Ho NJ, Sze SM, Tsai MJ Thin Solid Films, 520(5), 1656, 2011 |
83 |
High Density Ni Nanocrystals Formed by Coevaporating Ni and SiO2 Pellets for the Nonvolatile Memory Device Application Hu CW, Chang TC, Tu CH, Huang YH, Lin CC, Chen MC, Huang FS, Sze SM, Tseng TY Electrochemical and Solid State Letters, 13(3), H49, 2010 |
84 |
Unusual Threshold Voltage Shift Caused by Self-Heating-Induced Charge Trapping Effect Jian FY, Chang TC, Chu AK, Chen TC, Chen SC, Lin CS, Li HW, Lee MH, Chen JS, Shih CC Electrochemical and Solid State Letters, 13(4), H95, 2010 |
85 |
A 2 Bit Nonvolatile Memory Device with a Transistor Switch Function Accomplished with Edge-FN Tunneling Operation Jian FY, Chang TC, Chu AK, Chen SC, Chen TC, Hsu YE, Tseng HC, Lin CS, Young TF, Yang YL Electrochemical and Solid State Letters, 13(5), H166, 2010 |
86 |
Bipolar Resistive Switching Characteristics of Transparent Indium Gallium Zinc Oxide Resistive Random Access Memory Chen MC, Chang TC, Huang SY, Chen SC, Hu CW, Tsai CT, Sze SM Electrochemical and Solid State Letters, 13(6), II191, 2010 |
87 |
Preparation of a nonleaching, recoverable and recyclable palladium-complex catalyst for Heck coupling reactions by immobilization on Au nanoparticles Young JN, Chang TC, Tsai SC, Yang L, Yu SJ Journal of Catalysis, 272(2), 253, 2010 |
88 |
Asymmetric Negative Bias Temperature Instability Degradation of Poly-Si TFTs under Static Stress Weng CF, Chang TC, Jian FY, Chen SC, Lu J, Lu IC Journal of the Electrochemical Society, 157(1), H22, 2010 |
89 |
Degradation of Low Temperature Polycrystalline Silicon Thin Film Transistors under Negative Bias Temperature Instability Stress with Illumination Effect Lin CS, Chen YC, Chang TC, Li HW, Hsu WC, Chen SC, Tai YH, Jian FY, Chen TC, Tu KJ, Wu HH, Chen YC Journal of the Electrochemical Society, 157(2), J29, 2010 |
90 |
Nitric Acid Oxidation of Si for the Tunneling Oxide Application on CoSi2 Nanocrystals Nonvolatile Memory Hu CW, Chang TC, Tu CH, Chen YD, Lin CC, Chen MC, Lin JY, Sze SM, Tseng TY Journal of the Electrochemical Society, 157(3), H332, 2010 |