화학공학소재연구정보센터
검색결과 : 302건
No. Article
61 Spin injection in a semiconductor through a space-charge layer
Ghosh J, Windbacher T, Sverdlov V, Selberherr S
Solid-State Electronics, 101, 116, 2014
62 Probing space charge effect on electroluminescence of indium tin oxide (ITO)/N,N'-di-[(1-naphthyl)-N,N'-diphenyl]-(1,1'-biphenyl)-4,4'-diamine (alpha-NPD)/tris(8-hydroxy-quinolinato) aluminum (III) (Alq(3))/Al diodes by time-resolved electric-field-induced optical second-harmonic generation measurement
Sadakata A, Osada K, Taguchi D, Manaka T, Iwamoto M
Thin Solid Films, 554, 110, 2014
63 Energy structure and electro-optical properties of organic layers with carbazole derivative
Pudzs K, Vembris A, Muzikante I, Grzibovskis R, Turovska B, Simokaitiene J, Grigalevicius S, Grazulevicius JV
Thin Solid Films, 556, 405, 2014
64 Impact of Ga/(In plus Ga) profile in Cu(In,Ga)Se-2 prepared by multi-layer precursor method on its cell performance
Chantana J, Murata M, Higuchi T, Watanabe T, Teraji S, Kawamura K, Minemoto T
Thin Solid Films, 556, 499, 2014
65 Structural and electrical characteristics of lanthanum oxide formed on surface of LaB6 film by annealing
Igityan A, Kafadaryan Y, Aghamalyan N, Petrosyan S, Badalyan G, Hovsepyan R, Gambaryan I, Eganyan A, Semerjian H, Kuzanyan A
Thin Solid Films, 564, 415, 2014
66 Influence of Line Defects on the Electrical Properties of Single Crystal TiO2
Adepalli KK, Kelsch M, Merkle R, Maier J
Advanced Functional Materials, 23(14), 1798, 2013
67 A Large Magnetoresistance Effect in p-n Junction Devices by the Space-Charge Effect
Yang DZ, Wang FC, Ren Y, Zuo YL, Peng Y, Zhou SM, Xue DS
Advanced Functional Materials, 23(23), 2918, 2013
68 Proton Conduction in Dense and Porous Nanocrystalline Ceria Thin Films
Gregori G, Shirpour M, Maier J
Advanced Functional Materials, 23(47), 5861, 2013
69 The Electrical Properties of Highly Resistive Dusts
Riebel U, Aleksin Y, Vora A
Chemie Ingenieur Technik, 85(3), 235, 2013
70 CFD Modeling of Wet Electrostatic Precipitators in Coaxial Wire-Tube Configuration
Kaiser S, Fahlenkamp H, Walzel P
Chemie Ingenieur Technik, 85(3), 245, 2013