51 |
Mixing in vibrated granular beds with the effect of electrostatic ford Lu LS, Hsiau SS Powder Technology, 160(3), 170, 2005 |
52 |
Conductivity and distribution of charge on electroluminescent Si/SiO2 structures investigated by electrostatic force microscopy Suominen T, Paturi P, Huhtinen H, Heikkila L, Hedman HP, Punkkinen R, Laiho R Applied Surface Science, 222(1-4), 131, 2004 |
53 |
Effect of crystallographic orientation upon switching properties of PZT films measured by electrostatic force microscopy Desfeux R, Da Costa A, Flambard A, Legrand C, Tondelier D, Poullain G, Bouregba R Applied Surface Science, 228(1-4), 34, 2004 |
54 |
Surface potential mapping of biased pn junction with kelvin probe force microscopy: application to cross-section devices Doukkali A, Ledain S, Guasch C, Bonnet J Applied Surface Science, 235(4), 507, 2004 |
55 |
Electrostatic free energy of interacting ionizable double layers Biesheuvel PM Journal of Colloid and Interface Science, 275(2), 514, 2004 |
56 |
Characterization of double stacking faults induced by thermal processing of heavily N-doped 4H-SiC substrates Skromme BJ, Mikhov MK, Chen L, Samson G, Wang R, Li C, Bhat I Materials Science Forum, 457-460, 581, 2004 |
57 |
Influence of bonding parameters on electrostatic force in anodic wafer bonding Li GY, Wang L Thin Solid Films, 462-63, 334, 2004 |
58 |
Glass-to-glass anodic bonding process and electrostatic force Wei J, Nai SML, Wong CK, Lee LC Thin Solid Films, 462-63, 487, 2004 |
59 |
Resolution of Kelvin probe force microscopy in ultrahigh vacuum: comparison of experiment and simulation Sadewasser S, Glatzel T, Shikler R, Rosenwaks Y, Lux-Steiner MC Applied Surface Science, 210(1-2), 32, 2003 |
60 |
Amplitude or frequency modulation-detection in Kelvin probe force microscopy Glatzel T, Sadewasser S, Lux-Steiner MC Applied Surface Science, 210(1-2), 84, 2003 |