화학공학소재연구정보센터
검색결과 : 80건
No. Article
51 Mixing in vibrated granular beds with the effect of electrostatic ford
Lu LS, Hsiau SS
Powder Technology, 160(3), 170, 2005
52 Conductivity and distribution of charge on electroluminescent Si/SiO2 structures investigated by electrostatic force microscopy
Suominen T, Paturi P, Huhtinen H, Heikkila L, Hedman HP, Punkkinen R, Laiho R
Applied Surface Science, 222(1-4), 131, 2004
53 Effect of crystallographic orientation upon switching properties of PZT films measured by electrostatic force microscopy
Desfeux R, Da Costa A, Flambard A, Legrand C, Tondelier D, Poullain G, Bouregba R
Applied Surface Science, 228(1-4), 34, 2004
54 Surface potential mapping of biased pn junction with kelvin probe force microscopy: application to cross-section devices
Doukkali A, Ledain S, Guasch C, Bonnet J
Applied Surface Science, 235(4), 507, 2004
55 Electrostatic free energy of interacting ionizable double layers
Biesheuvel PM
Journal of Colloid and Interface Science, 275(2), 514, 2004
56 Characterization of double stacking faults induced by thermal processing of heavily N-doped 4H-SiC substrates
Skromme BJ, Mikhov MK, Chen L, Samson G, Wang R, Li C, Bhat I
Materials Science Forum, 457-460, 581, 2004
57 Influence of bonding parameters on electrostatic force in anodic wafer bonding
Li GY, Wang L
Thin Solid Films, 462-63, 334, 2004
58 Glass-to-glass anodic bonding process and electrostatic force
Wei J, Nai SML, Wong CK, Lee LC
Thin Solid Films, 462-63, 487, 2004
59 Resolution of Kelvin probe force microscopy in ultrahigh vacuum: comparison of experiment and simulation
Sadewasser S, Glatzel T, Shikler R, Rosenwaks Y, Lux-Steiner MC
Applied Surface Science, 210(1-2), 32, 2003
60 Amplitude or frequency modulation-detection in Kelvin probe force microscopy
Glatzel T, Sadewasser S, Lux-Steiner MC
Applied Surface Science, 210(1-2), 84, 2003