검색결과 : 69건
No. | Article |
---|---|
31 |
Ammonia adsorption and decomposition on silica supported Rh nanoparticles observed by in situ attenuated total reflection infrared spectroscopy Leewis CM, Kessels WMM, van de Sanden MCM, Niemantsverdriet JW Applied Surface Science, 253(2), 572, 2006 |
32 |
Low-temperature deposition of TiN by plasma-assisted atomic layer deposition Heil SBS, Langereis E, Roozeboom F, van de Sanden MCM, Kessels WMM Journal of the Electrochemical Society, 153(11), G956, 2006 |
33 |
Attenuated total reflection infrared spectroscopy for studying adsorbates on planar model catalysts: CO adsorption on silica supported Rh nanoparticles Leewis CM, Kessels WMM, de Sanden MCMV, Van de Sanden MCM, Niemantsverdriet JW Journal of Vacuum Science & Technology A, 24(2), 296, 2006 |
34 |
High-rate plasma-deposited SiO2 films for surface passivation of crystalline silicon Hoex B, Peeters FJJ, Creatore M, Blauw MA, Kessels WMM, van de Sanden MCM Journal of Vacuum Science & Technology A, 24(5), 1823, 2006 |
35 |
Amorphous silicon layer characteristics during 70-2000 eV Ar+-ion bombardment of Si(100) Stevens AAE, Kessels WMM, van de Sanden MCM, Beijerinck HCW Journal of Vacuum Science & Technology A, 24(5), 1933, 2006 |
36 |
Real-time study of HWCVD a-Si : H film growth using optical second harmonic generation spectroscopy Aarts IMP, Gielis JJH, Grauls PMJ, Leewis CM, van de Sanden MCM, Kessels WMM Thin Solid Films, 501(1-2), 70, 2006 |
37 |
Substrate temperature dependence of the roughness evolution of HWCVD a-Si : H spectroscopic ellipsometry Kessels WMM, Hoefnagels JPM, Langereis E, van de Sanden MCM Thin Solid Films, 501(1-2), 88, 2006 |
38 |
The role of plasma induced substrate heating during high rate deposition of microcrystalline silicon solar cells van den Donker MN, Schmitz R, Appenzeller W, Rech B, Kessels WMM, van de Sanden MCM Thin Solid Films, 511, 562, 2006 |
39 |
Dry etching of surface textured zinc oxide using a remote argon-hydrogen plasma Groenen R, Creatore M, van de Sanden MCM Applied Surface Science, 241(3-4), 321, 2005 |
40 |
Threshold ionization mass spectrometry study of hydrogenated amorphous carbon films growth precursors Benedikt J, Eijkman DJ, Vandamme W, Agarwal S, van de Sanden MCM Chemical Physics Letters, 402(1-3), 37, 2005 |