화학공학소재연구정보센터
검색결과 : 72건
No. Article
31 Impact of growth rate on impurities segregation at grain boundaries in silicon during Bridgman growth
Autruffe A, Vines L, Arnberg L, Di Sabatino M
Journal of Crystal Growth, 372, 180, 2013
32 Reversible Lithium Storage with High Mobility at Structural Defects in Amorphous Molybdenum Dioxide Electrode
Ku JH, Ryu JH, Kim SH, Han OH, Oh SM
Advanced Functional Materials, 22(17), 3658, 2012
33 Facile Synthesis of Linear and Hyperbranched Ladder Poly(p-Phenylene)s without Structural Defects
Bai LB, Li DZ, Lu H, Wu YG, Ba XW, Bo ZS
Macromolecular Rapid Communications, 33(20), 1787, 2012
34 Influence of Structural Feature of Aluminum Coatings on Mechanical and Water Barrier Properties of Metallized PET Films
Garnier G, Yrieix B, Brechet Y, Flandin L
Journal of Applied Polymer Science, 115(5), 3110, 2010
35 Investigation by EELS and TRIM simulation method of the interaction of Ar+ and N+ ions with the InP compound
Berrouachedi N, Bouslama M, Abdellaoui A, Ghaffour M, Jardin C, Hamaida K, Monteil Y, Lounis Z, Ouerdane A
Applied Surface Science, 256(1), 21, 2009
36 Microstructural investigation of 3C-SiC islands grown by VLS mechanism on 6H-SiC substrate
Andreadou A, Soueidan M, Tsiaoussis I, Polychroniadis EK, Ferro G, Frangis N
Journal of Crystal Growth, 310(7-9), 1799, 2008
37 Modelling the formation of structural defects during the suspension polymerization of vinyl chloride
Wieme J, Marin GB, Reyniers MF
Chemical Engineering Science, 62(18-20), 5300, 2007
38 Point and structural defects in Bi2PbxTe3 single crystals
Plechacek T, Navratil J, Horak J, Bachan D, Krejcova A, Lost'ak P
Solid State Ionics, 177(39-40), 3513, 2007
39 Electrical behaviour of SiOxNy thin films and correlation with structural defects
Rebib F, Tomasella E, Aida S, Dubois M, Cellier J, Jacquet M
Applied Surface Science, 252(15), 5607, 2006
40 Laser manipulation of clusters, structural defects and nanoaggregates in barrier structures on silicon and binary semi-conductors
Vorobets GI, Vorobets OI, Strebegev VN
Applied Surface Science, 247(1-4), 590, 2005