화학공학소재연구정보센터
검색결과 : 158건
No. Article
31 Spectroellipsometric and ion beam analytical studies on a glazed ceramic object with metallic lustre decoration
Lohner T, Agocs E, Petrik P, Zolnai Z, Szilagyi E, Kovacs I, Szokefalvi-Nagy Z, Toth L, Toth AL, Illes L, Barsony I
Thin Solid Films, 571, 715, 2014
32 Influence of the source gas ratio on the hydrogen and deuterium content of a-C:H and a-C:D films: Plasma-enhanced CVD with CH4/H-2, CH4/D-2, CD4/H-2 and CD4/D-2
Ozeki K, Sekiba D, Suzuki T, Kanda K, Niibe M, Hirakuri KK, Masuzawa T
Applied Surface Science, 265, 750, 2013
33 The characterization of PEEK, PET and PI implanted with Co ions to high fluences
Mackova A, Malinsky P, Miksova R, Khaibullin RI, Valeev VF, Svorcik V, Slepicka P, Slouf M
Applied Surface Science, 275, 311, 2013
34 Graphitic structure formation in ion implanted polyetheretherketone
Tavenner E, Wood B, Curry M, Jankovic A, Patel R
Applied Surface Science, 283, 154, 2013
35 Nanocomposite Ag:TiN thin films for dry biopotential electrodes
Pedrosa P, Machado D, Lopes C, Alves E, Barradas NP, Martin N, Macedo F, Fonseca C, Vaz F
Applied Surface Science, 285, 40, 2013
36 Growth dynamics of interfacially polymerized polyamide layers by diffuse reflectance spectroscopy and Rutherford backscattering spectrometry
Matthews TD, Yan H, Cahill DG, Coronell O, Marinas BJ
Journal of Membrane Science, 429, 71, 2013
37 RBS depth profiling and optical characterization of multilayers of TiO2 (20 nm) and Ge (15 nm)
Hussain MS, Mehmood M, Ahmad J, Tanvir MT, Khan AF, Ali T, Mahmood A
Materials Chemistry and Physics, 139(1), 17, 2013
38 Structural, morphological and electronic study of CVD SnO2:Sb films
Haireche S, Boumeddiene A, Guittoum A, El Hdiy A, Boufelfel A
Materials Chemistry and Physics, 139(2-3), 871, 2013
39 Hot-wire chemical vapor deposition of WO3-x thin films of various oxygen contents
Houweling ZS, Geus JW, Schropp REI
Materials Chemistry and Physics, 140(1), 89, 2013
40 Effects of current density and electrolyte temperature on the volume expansion factor of anodic alumina formed in oxalic acid
Zhou F, Baron-Wiechec A, Garcia-Vergara SJ, Curioni M, Habazaki H, Skeldon P, Thompson GE
Electrochimica Acta, 59, 186, 2012