화학공학소재연구정보센터
검색결과 : 158건
No. Article
21 Silicide phases formation in Co/c-Si and Co/a-Si systems during thermal annealing
Novakovic M, Popovic M, Zhang K, Lieb KP, Bibic N
Applied Surface Science, 295, 158, 2014
22 Physical vapour deposition reactive magnetron sputtering for the production and application of dichroics in photovoltaic system with solar spectral splitting
Raniero W, Campostrini M, Maggioni G, Della Mea G, Quaranta A
Applied Surface Science, 308, 170, 2014
23 Trends and applications for MeV electrostatic ion beam accelerators
Norton GA, Stodola SE
Applied Surface Science, 310, 89, 2014
24 Thermoelectric properties of Zn4Sb3/CeFe(4-x)CoxSb12 nano-layered superlattices modified by MeV Si ion beam
Budak S, Guner S, Minamisawa RA, Muntele CI, Ila D
Applied Surface Science, 310, 226, 2014
25 Channeled PIXE and magnetic measurements in Co implanted and thermally annealed ZnO single crystals
Werner Z, Ratajczak R, Gosk J, Barlak M, Twardowski A, Pochrybniak C, Zhao Q
Applied Surface Science, 310, 242, 2014
26 Loss of implanted heavy elements during annealing of ultra-shallow ion-implanted silicon: The complete picture
Chan TK, Koh SY, Fang V, Markwitz A, Osipowicz T
Applied Surface Science, 314, 322, 2014
27 Elicitation of metastasis associated protein 2 expression in the phagocytosis by murine testicular Sertoli cells
Zhu CJ, Zhang S, Liang Y, Li W
Biochemical and Biophysical Research Communications, 445(3), 667, 2014
28 Viral and chloroplastic signals essential for initiation and efficiency of translation in Agrobacterium tumefaciens
Ahmad T, Venkataraman S, Hefferon K, AbouHaidar MG
Biochemical and Biophysical Research Communications, 452(1), 14, 2014
29 Tuning of ripple patterns and wetting dynamics of Si (100) surface using ion beam irradiation
Kumar T, Singh UB, Kumar M, Ojha S, Kanjilal D
Current Applied Physics, 14(3), 312, 2014
30 Formation of barrier-type anodic films on ZE41 magnesium alloy in a fluoride/glycerol electrolyte
Hernandez-Lopez JM, Nemcova A, Zhong XL, Liu H, Arenas MA, Haigh SJ, Burke MG, Skeldon P, Thompson GE
Electrochimica Acta, 138, 124, 2014