11 |
Influence of rapid thermal annealing on electrical and structural properties of double metal structure Au/Ni/n-InP (111) diodes Reddy MB, Janardhanam V, Kumar AA, Reddy VR, Reddy PN Current Applied Physics, 10(2), 687, 2010 |
12 |
Origins of the temperature dependence of the series resistance, ideality factor and barrier height based on the thermionic emission model for n-type GaN Schottky diodes Lin YJ Thin Solid Films, 519(2), 829, 2010 |
13 |
Effect of annealing temperature on electrical and structural properties of transparent indium tin oxide electrode to n-type GaN Rao PK, Reddy VR Materials Chemistry and Physics, 114(2-3), 821, 2009 |
14 |
Investigation of unusual shunting behavior due to phototransistor effect in n-type aluminum-alloyed rear junction solar cells Sugianto A, Tjahjono BS, Mai L, Wenham SR Solar Energy Materials and Solar Cells, 93(11), 1986, 2009 |
15 |
Effect of cryogenic temperature deposition on Au contacts to bulk, single-crystal n-type ZnO Wright JS, Khanna R, Voss LF, Stafford L, Gila BP, Norton DP, Pearton SJ, Wang HT, Jang S, Anderson T, Chen JJ, Kang BS, Ren F, Shen H, LaRoche JR, Ip K Applied Surface Science, 253(8), 3766, 2007 |
16 |
Temperature dependence of the current-voltage characteristics of the Al/Rhodamine-101/p-Si(100) contacts Karatas S, Temirci C, Cakar M, Turut A Applied Surface Science, 252(6), 2209, 2006 |
17 |
ZrB2 Schottky diode contacts on n-GaN Khanna R, Ramani K, Cracium V, Singh R, Pearton SJ, Ren F, Kravchenko II Applied Surface Science, 253(4), 2315, 2006 |
18 |
Comparison of transport properties in carbon nanotube field-effect transistors with Schottky contacts and doped source/drain contacts Knoch J, Mantl S, Appenzeller J Solid-State Electronics, 49(1), 73, 2005 |
19 |
Changes in the electronic structure of DiMePTCDI films on S-GaAs(100) upon exposure to oxygen Gavrila G, Mendez H, Kampen TU, Zahn DRT Applied Surface Science, 234(1-4), 126, 2004 |
20 |
Barrier heights of organic modified Schottky contacts: theory and experiment Kampen T, Bekkali A, Thurzo I, Zahn DRT, Bolognesi A, Ziller T, Di Carlo A, Lugli P Applied Surface Science, 234(1-4), 313, 2004 |