화학공학소재연구정보센터
검색결과 : 42건
No. Article
11 Influence of rapid thermal annealing on electrical and structural properties of double metal structure Au/Ni/n-InP (111) diodes
Reddy MB, Janardhanam V, Kumar AA, Reddy VR, Reddy PN
Current Applied Physics, 10(2), 687, 2010
12 Origins of the temperature dependence of the series resistance, ideality factor and barrier height based on the thermionic emission model for n-type GaN Schottky diodes
Lin YJ
Thin Solid Films, 519(2), 829, 2010
13 Effect of annealing temperature on electrical and structural properties of transparent indium tin oxide electrode to n-type GaN
Rao PK, Reddy VR
Materials Chemistry and Physics, 114(2-3), 821, 2009
14 Investigation of unusual shunting behavior due to phototransistor effect in n-type aluminum-alloyed rear junction solar cells
Sugianto A, Tjahjono BS, Mai L, Wenham SR
Solar Energy Materials and Solar Cells, 93(11), 1986, 2009
15 Effect of cryogenic temperature deposition on Au contacts to bulk, single-crystal n-type ZnO
Wright JS, Khanna R, Voss LF, Stafford L, Gila BP, Norton DP, Pearton SJ, Wang HT, Jang S, Anderson T, Chen JJ, Kang BS, Ren F, Shen H, LaRoche JR, Ip K
Applied Surface Science, 253(8), 3766, 2007
16 Temperature dependence of the current-voltage characteristics of the Al/Rhodamine-101/p-Si(100) contacts
Karatas S, Temirci C, Cakar M, Turut A
Applied Surface Science, 252(6), 2209, 2006
17 ZrB2 Schottky diode contacts on n-GaN
Khanna R, Ramani K, Cracium V, Singh R, Pearton SJ, Ren F, Kravchenko II
Applied Surface Science, 253(4), 2315, 2006
18 Comparison of transport properties in carbon nanotube field-effect transistors with Schottky contacts and doped source/drain contacts
Knoch J, Mantl S, Appenzeller J
Solid-State Electronics, 49(1), 73, 2005
19 Changes in the electronic structure of DiMePTCDI films on S-GaAs(100) upon exposure to oxygen
Gavrila G, Mendez H, Kampen TU, Zahn DRT
Applied Surface Science, 234(1-4), 126, 2004
20 Barrier heights of organic modified Schottky contacts: theory and experiment
Kampen T, Bekkali A, Thurzo I, Zahn DRT, Bolognesi A, Ziller T, Di Carlo A, Lugli P
Applied Surface Science, 234(1-4), 313, 2004