화학공학소재연구정보센터
검색결과 : 28건
No. Article
11 Hydrogen-induced blistering of Mo/Si multilayers: Uptake and distribution
Kuznetsov AS, Gleeson MA, Bijkerk F
Thin Solid Films, 545, 571, 2013
12 Non-constant diffusion characteristics of nanoscopic Mo-Si interlayer growth
Bosgra J, Verhoeven J, van de Kruijs RWE, Yakshin AE, Bijkerk F
Thin Solid Films, 522, 228, 2012
13 In-situ study of the diffusion-reaction mechanism in Mo/Si multilayered films
Bruijn S, van de Kruijs RWE, Yakshin AE, Bijkerk F
Applied Surface Science, 257(7), 2707, 2011
14 Reduction of interlayer thickness by low-temperature deposition of Mo/Si multilayer mirrors for X-ray reflection
de Rooij-Lohmann VITA, Yakshin AE, Zoethout E, Verhoeven J, Bijkerk F
Applied Surface Science, 257(14), 6251, 2011
15 In situ ellipsometry study of atomic hydrogen etching of extreme ultraviolet induced carbon layers
Chen JQ, Louis E, Harmsen R, Tsarfati T, Wormeester H, van Kampen M, van Schaik W, van de Kruijs R, Bijkerk F
Applied Surface Science, 258(1), 7, 2011
16 Co-adsorption of NH3 and SO2 on quartz(0001): Formation of a stabilized complex
Grecea ML, Gleeson MA, van Schaik W, Kleyn AW, Bijkerk F
Chemical Physics Letters, 511(4-6), 270, 2011
17 Co-adsorption of NH3 and SO2 on quartz(0 0 0 1): Formation of a stabilized complex (vol 511, pg 270, 2011)
Grecea ML, Gleeson MA, van Schaik W, Kleyn AW, Bijkerk F
Chemical Physics Letters, 516(1-3), 111, 2011
18 Roughness evolution of Si surfaces upon Ar ion erosion
de Rooij-Lohmann VITA, Kozhevnikov IV, Peverini L, Ziegler E, Cuerno R, Bijkerk F, Yakshin AE
Applied Surface Science, 256(16), 5011, 2010
19 Secondary electron yield measurements of carbon covered multilayer optics
Chen JQ, Louis E, Verhoeven J, Harmsen R, Lee CJ, Lubomska M, van Kampen M, van Schaik W, Bijkerk F
Applied Surface Science, 257(2), 354, 2010
20 Surface morphology of Kr+-polished amorphous Si layers
van den Boogaard AJR, Louis E, Zoethout E, Mullender S, Bijkerk F
Journal of Vacuum Science & Technology A, 28(4), 552, 2010