검색결과 : 28건
No. | Article |
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11 |
Hydrogen-induced blistering of Mo/Si multilayers: Uptake and distribution Kuznetsov AS, Gleeson MA, Bijkerk F Thin Solid Films, 545, 571, 2013 |
12 |
Non-constant diffusion characteristics of nanoscopic Mo-Si interlayer growth Bosgra J, Verhoeven J, van de Kruijs RWE, Yakshin AE, Bijkerk F Thin Solid Films, 522, 228, 2012 |
13 |
In-situ study of the diffusion-reaction mechanism in Mo/Si multilayered films Bruijn S, van de Kruijs RWE, Yakshin AE, Bijkerk F Applied Surface Science, 257(7), 2707, 2011 |
14 |
Reduction of interlayer thickness by low-temperature deposition of Mo/Si multilayer mirrors for X-ray reflection de Rooij-Lohmann VITA, Yakshin AE, Zoethout E, Verhoeven J, Bijkerk F Applied Surface Science, 257(14), 6251, 2011 |
15 |
In situ ellipsometry study of atomic hydrogen etching of extreme ultraviolet induced carbon layers Chen JQ, Louis E, Harmsen R, Tsarfati T, Wormeester H, van Kampen M, van Schaik W, van de Kruijs R, Bijkerk F Applied Surface Science, 258(1), 7, 2011 |
16 |
Co-adsorption of NH3 and SO2 on quartz(0001): Formation of a stabilized complex Grecea ML, Gleeson MA, van Schaik W, Kleyn AW, Bijkerk F Chemical Physics Letters, 511(4-6), 270, 2011 |
17 |
Co-adsorption of NH3 and SO2 on quartz(0 0 0 1): Formation of a stabilized complex (vol 511, pg 270, 2011) Grecea ML, Gleeson MA, van Schaik W, Kleyn AW, Bijkerk F Chemical Physics Letters, 516(1-3), 111, 2011 |
18 |
Roughness evolution of Si surfaces upon Ar ion erosion de Rooij-Lohmann VITA, Kozhevnikov IV, Peverini L, Ziegler E, Cuerno R, Bijkerk F, Yakshin AE Applied Surface Science, 256(16), 5011, 2010 |
19 |
Secondary electron yield measurements of carbon covered multilayer optics Chen JQ, Louis E, Verhoeven J, Harmsen R, Lee CJ, Lubomska M, van Kampen M, van Schaik W, Bijkerk F Applied Surface Science, 257(2), 354, 2010 |
20 |
Surface morphology of Kr+-polished amorphous Si layers van den Boogaard AJR, Louis E, Zoethout E, Mullender S, Bijkerk F Journal of Vacuum Science & Technology A, 28(4), 552, 2010 |