화학공학소재연구정보센터
검색결과 : 44건
No. Article
11 Advances in nanoscale characterization of refined nanoporous gold
El-Zoka AA, Langelier B, Korinek A, Botton GA, Newman RC
Electrochimica Acta, 283, 611, 2018
12 Versatility of doped nanocrystalline silicon oxide for applications in silicon thin-film and heterojunction solar cells
Richter A, Smirnov V, Lambertz A, Nomoto K, Welter K, Ding KN
Solar Energy Materials and Solar Cells, 174, 196, 2018
13 Understanding arsenic incorporation in CdTe with atom probe tomography
Burton GL, Diercks DR, Ogedengbe OS, Jayathilaka PARD, Edirisooriya M, Myers TH, Zaunbrecher KN, Moseley J, Barnes TM, Gorman BP
Solar Energy Materials and Solar Cells, 182, 68, 2018
14 Morphological and micro-structural interface characterization in multilayer inverted polymer-fullerene bulk heterojunction solar cells
Jouane A, Moubah R, Schmerber G, Larde R, Odarchenko Y, Ivanov DA, Lassri H, Chapuis YA, Jouane Y
Solar Energy Materials and Solar Cells, 180, 258, 2018
15 Effects of optical dopants and laser wavelength on atom probe tomography analyses of borosilicate glasses
Lu XN, Schreiber DK, Neeway JJ, Ryan JV, Du JC
Journal of the American Ceramic Society, 100(10), 4801, 2017
16 Exploring the high entropy alloy concept in (AlTiVNbCr)N
Yalamanchili K, Wang F, Schramm IC, Andersson JM, Joesaar MPJ, Tasnadi F, Mucklich F, Ghafoor N, Oden M
Thin Solid Films, 636, 346, 2017
17 Self Focusing SIMS: Probing thin film composition in very confined volumes
Franquet A, Douhard B, Melkonyan D, Favia P, Conard T, Vandervorst W
Applied Surface Science, 365, 143, 2016
18 Understanding of the field evaporation of surface modified oxide materials through transmission electron microscopy and atom probe tomography
Seol JB, Kwak CM, Kim YT, Park CG
Applied Surface Science, 368, 368, 2016
19 Atom probe tomography evidence for uniform incorporation of Bi across the growth front in GaAs1-xBix/GaAs superlattice
Chen WX, Ronsheim PA, Wood AW, Forghani K, Guan YX, Kuech TF, Babcock SE
Journal of Crystal Growth, 446, 27, 2016
20 Topography and structure of ultrathin topological insulator Sb2Te3 films on Si(111) grown by means of molecular beam epitaxy
Lanius M, Kampmeier J, Kolling S, Mussler G, Koenraad PM, Grutzmacher D
Journal of Crystal Growth, 453, 158, 2016