검색결과 : 1,289건
No. | Article |
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991 |
LEXES and SIMS as complementary techniques for full quantitative characterization of nanometer structures Hombourger C, Staub R, Schuhmacher M, Desse F, de Chambost E, Hitzman C Applied Surface Science, 203, 383, 2003 |
992 |
Extremely deep SIMS profiling: oxygen in FZ silicon Barcz A, Zielinski M, Nossarzewska E, Lindstroem G Applied Surface Science, 203, 396, 2003 |
993 |
TOF-SIMS as a rapid diagnostic tool to monitor the growth mode of thin (high k) films Conard T, Vandervorst W, Petry J, Zhao C, Besling W, Nohira H, Richard O Applied Surface Science, 203, 400, 2003 |
994 |
Application of SIMS in microelectronics Tsukamoto K, Yoshikawa S, Toujou F, Morita H Applied Surface Science, 203, 404, 2003 |
995 |
SIMS and high-resolution RBS analysis of ultrathin SiOxNy films Kimura K, Nakajima K, Kobayashi H, Miwa S, Satori K Applied Surface Science, 203, 418, 2003 |
996 |
Quantitative depth profiling of nitrogen in ultrathin oxynitride film with low energy SIMS Shon HK, Kang HJ, Hong TE, Chang HS, Kim KJ, Kim HK, Moon DW Applied Surface Science, 203, 423, 2003 |
997 |
Solubility limits of dopants in 4H-SiC Linnarsson MK, Zimmermann U, Wong-Leung J, Schoner A, Janson MS, Jagadish C, Svensson BG Applied Surface Science, 203, 427, 2003 |
998 |
Adventures in molecular electronics: how to attach wires to molecules Haynie BC, Walker AV, Tighe TB, Allara DL, Winograd N Applied Surface Science, 203, 433, 2003 |
999 |
Gate oxide properties investigated by TOF-SIMS profiles on CMOS devices Zanderigo F, Brazzelli D, Rocca S, Pregnolato A, Grossi A, Queirolo G Applied Surface Science, 203, 437, 2003 |
1000 |
TOF-SIMS depth profiling of SIMON Ge X, Gui D, Chen X, Cha LZ, Brox O, Benninghoven A Applied Surface Science, 203, 441, 2003 |