91 |
Study of the morphology of ultra-thin Pt films as the anode of an organic light emitting display Lee CH, Tzeng YD Thin Solid Films, 517(17), 5116, 2009 |
92 |
Bottom and top AF/FM interfaces of NiFe/FeMn/NiFe trilayers Nascimento VP, Passamani EC, Alvarenga AD, Biondo A, Pelegrini F, Saitovitch EB Applied Surface Science, 254(7), 2114, 2008 |
93 |
Mixed 2D molecular systems: Mechanic, thermodynamic and dielectric properties Beno J, Weis M, Dobrocka E, Hasko D Applied Surface Science, 254(20), 6370, 2008 |
94 |
Determination of microscopic interaction constants by X-ray reflectivity measurements Lehmkuhler F, Paulus M, Streit-Nierobisch S, Tolan M Fluid Phase Equilibria, 268(1-2), 95, 2008 |
95 |
Structure and redox behavior of azobenzene-containing monolayers on Au(111): A combined STM, X-ray reflectivity, and voltammetry study Jung U, Baisch B, Kaminski D, Krug K, Eisen A, Weineisen T, Raffa D, Steaner J, Bornholdt C, Herges R, Magnussen O Journal of Electroanalytical Chemistry, 619, 152, 2008 |
96 |
Applicability of X-ray reflectometry to studies of polymer solar cell degradation Andreasen JW, Gevorgyan SA, Schleputz CM, Krebs FC Solar Energy Materials and Solar Cells, 92(7), 793, 2008 |
97 |
Charged molecular effect on the degree of ordering of mesostructured silica thin film templated by mixed ionic micelles Kwon SY, Kim JC, Choi BI Thin Solid Films, 516(10), 2843, 2008 |
98 |
The comparative study of thermal stability among silicon dioxide, fluorinated silicate glass, hydrogen silsesquioxane, and organosilicate glass dielectrics on silicon Jeng JS, Chen JS Thin Solid Films, 516(18), 6013, 2008 |
99 |
Comparative study of the growth of sputtered aluminum oxide films on organic and inorganic substrates Sellner S, Gerlach A, Kowarik S, Schreiber F, Dosch H, Meyer S, Pflaum J, Ulbricht G Thin Solid Films, 516(18), 6377, 2008 |
100 |
Analysis of water condensation in P123 templated 2D hexagonal mesoporous silica films by X-ray reflectivity Yan MH, Dourdain S, Gibaud A Thin Solid Films, 516(22), 7955, 2008 |