화학공학소재연구정보센터
검색결과 : 10건
No. Article
1 Effect of long-term storage on the electronic structure of semiconducting silicon wafers implanted by rhenium ions
Zatsepin DA, Boukhvalov DW, Zatsepin AF, Mikhaylov AN, Gerasimenko NN, Zaporozhan OA
Journal of Materials Science, 56(3), 2103, 2021
2 Electronic structure, charge transfer, and intrinsic luminescence of gadolinium oxide nanoparticles: Experiment and theory
Zatsepin DA, Boukhvalov DW, Zatsepin AF, Kuznetsova YA, Mashkovtsev MA, Rychkov VN, Shur VY, Esin AA, Kurmaev EZ
Applied Surface Science, 436, 697, 2018
3 Soft electronic structure modulation of surface (thin-film) and bulk (ceramics) morphologies of TiO2-host by Pb-implantation: XPS-and-DFT characterization
Zatsepin DA, Boukhvalov DW, Gavrilov NV, Zatsepin AF, Shur VY, Esin AA, Kim SS, Kurmaev EZ
Applied Surface Science, 400, 110, 2017
4 XPS-and-DFT analyses of the Pb 4f-Zn 3s and Pb 5d-O 2s overlapped ambiguity contributions to the final electronic structure of bulk and thin-film Pb-modulated zincite
Zatsepin DA, Boukhvalov DW, Gavrilov NV, Kurmaev EZ, Zatsepin AF, Cui L, Shur VY, Esin AA
Applied Surface Science, 405, 129, 2017
5 Sn-loss effect in a Sn-implanted a-SiO2 host-matrix after thermal annealing: A combined XPS, PL, and DFT study
Zatsepin DA, Zatsepin AF, Boukhvalov DW, Kurmaev EZ, Gavrilov NV
Applied Surface Science, 367, 320, 2016
6 Pleomorphic structural imperfections caused by pulsed Bi-implantation in the bulk and thin-film morphologies of TiO2
Zatsepin DA, Boukhvalov DW, Kurmaev EZ, Gavrilov NV, Kim SS, Zhidkov IS
Applied Surface Science, 379, 223, 2016
7 XPS and DFT study of pulsed Bi-implantation of bulk and thin-films of ZnO-The role of oxygen imperfections
Zatsepin DA, Boukhvalov DW, Gavrilov NV, Kurmaev EZ, Zhidkov IS
Applied Surface Science, 387, 1093, 2016
8 Formation of Ge-0 and GeOx nanoclusters in Ge+-implanted SiO2/Sithin-film heterostructures under rapid thermal annealing
Zatsepin AF, Zatsepin DA, Zhidkov IS, Kurmaev EZ, Fitting HJ, Schmidt B, Mikhailovich AP, Lawniczak-Jablonska K
Applied Surface Science, 349, 780, 2015
9 Structural defects and electronic structure of N-ion implanted TiO2: Bulk versus thin film
Zatsepin DA, Boukhvalov DW, Kurmaev EZ, Zhidkov IS, Gavrilov NV, Korotin MA, Kim SS
Applied Surface Science, 355, 984, 2015
10 X-ray emission study of ion beam mixed Cu/Al films on polyimide
Kurmaev EZ, Zatsepin DA, Winarski RP, Stadler S, Ederer DL, Moewes A, Fedorenko VV, Shamin SN, Galakhov VR, Chang GS, Whang CN
Journal of Vacuum Science & Technology A, 17(2), 593, 1999