검색결과 : 36건
No. | Article |
---|---|
1 |
Secondary ion mass spectrometry characterization of anomalous behavior for low dose ion implanted phosphorus in silicon Penley C, Stevie FA, Griffis DP, Siebel S, Kulig L, Lee J Journal of Vacuum Science & Technology B, 28(3), 511, 2010 |
2 |
On the origin of aluminum-related cathodoluminescence emissions from sublimation grown 4H-SiC(11(2)over-bar0) Bishop SM, Reynolds CL, Molstad JC, Stevie FA, Barnhardt DE, Davis RF Applied Surface Science, 255(13-14), 6535, 2009 |
3 |
Model study of electron beam charge compensation for positive secondary ion mass spectrometry using a positive primary ion beam Zhu ZM, Stevie FA, Griffis DP Applied Surface Science, 254(9), 2708, 2008 |
4 |
Quantification in dynamic SIMS: Current status and future needs Stevie FA, Griffis DP Applied Surface Science, 255(4), 1364, 2008 |
5 |
Sublimation growth of an in-situ-deposited layer in SiC chemical vapor deposition on 4H-SiC(1 1 (2)over-bar 0) Bishop SM, Reynolds CL, Liliental-Weber Z, Uprety Y, Ebert CW, Stevie FA, Park JS, Davis RF Journal of Crystal Growth, 311(1), 72, 2008 |
6 |
Mass fractionation of carbon and hydrogen secondary ions upon Cs+ and O-2(+) bombardment of organic materials Harton SE, Zhu ZM, Stevie FA, Griffis DP, Ade H Journal of Vacuum Science & Technology A, 25(3), 480, 2007 |
7 |
Improved understanding of an electron beam charge compensation method for magnetic sector secondary ion mass spectrometer analysis of insulators Zhu Z, Gu C, Stevie FA, Griffis DP Journal of Vacuum Science & Technology A, 25(4), 769, 2007 |
8 |
Back side SIMS analysis of hafnium silicate Gu C, Stevie FA, Bennett J, Garcia R, GriffiS DP Applied Surface Science, 252(19), 7179, 2006 |
9 |
SIMS depth profiling of deuterium labeled polymers in polymer multilayers Harton SE, Stevie FA, Griffis DP, Ade H Applied Surface Science, 252(19), 7224, 2006 |
10 |
SIMS quantification of matrix and impurity species in AlxGa1-xN Gu CJ, Stevie FA, Hitzman CJ, Saripalli YN, Johnson M, Griffis DP Applied Surface Science, 252(19), 7228, 2006 |