화학공학소재연구정보센터
검색결과 : 30건
No. Article
1 Specific contact resistance of IGZO thin film transistors with metallic and transparent conductive oxides electrodes and XPS study of the contact/semiconductor interfaces
Rivas-Aguilar ME, Hernandez-Como N, Gutierrez-Heredia G, Sanchez-Martinez A, Ramirez MM, Mejia I, Quevedo-Lopez MA
Current Applied Physics, 18(7), 834, 2018
2 Study on the measurement accuracy of circular transmission line model for low-resistance Ohmic contacts on III-V wide band-gap semiconductors
Liu T, Huang R, Li FS, Huang ZL, Zhang J, Liu JP, Zhang LQ, Zhang SM, An DS, Yang H
Current Applied Physics, 18(7), 853, 2018
3 Specific contact resistance of IGZO thin film transistors with metallic and transparent conductive oxides electrodes and XPS study of the contact/semiconductor interfaces
Rivas-Aguilar ME, Hernandez-Como N, Gutierrez-Heredia G, Sanchez-Martinez A, Ramirez MM, Mejia I, Quevedo-Lopez MA
Current Applied Physics, 18(7), 834, 2018
4 Study on the measurement accuracy of circular transmission line model for low-resistance Ohmic contacts on III-V wide band-gap semiconductors
Liu T, Huang R, Li FS, Huang ZL, Zhang J, Liu JP, Zhang LQ, Zhang SM, An DS, Yang H
Current Applied Physics, 18(7), 853, 2018
5 Specific contact resistance of IGZO thin film transistors with metallic and transparent conductive oxides electrodes and XPS study of the contact/semiconductor interfaces
Rivas-Aguilar ME, Hernandez-Como N, Gutierrez-Heredia G, Sanchez-Martinez A, Ramirez MM, Mejia I, Quevedo-Lopez MA
Current Applied Physics, 18(7), 834, 2018
6 Study on the measurement accuracy of circular transmission line model for low-resistance Ohmic contacts on III-V wide band-gap semiconductors
Liu T, Huang R, Li FS, Huang ZL, Zhang J, Liu JP, Zhang LQ, Zhang SM, An DS, Yang H
Current Applied Physics, 18(7), 853, 2018
7 High-efficiency, single-crystalline, p- and n-type Si solar cells: Microstructure and chemical analysis of the glass layer
Kumar P, Aabdin Z, Pfeffer M, Eibl O
Solar Energy Materials and Solar Cells, 178, 52, 2018
8 Application of CTLM method combining interfacial structure characterization to investigate contact formation of silver paste metallization on crystalline silicon solar cells
Xiong SH, Yuan X, Tong H, Yang YX, Liu C, Ye XJ, Li YS, Wang XH, Luo L
Solid-State Electronics, 142, 1, 2018
9 Multi-wire metallization for solar cells: Contact resistivity of the interface between the wires and In2O3:Sn, In2O3:F, and ZnO:Al layers
Untila GG, Kost TN, Chebotareva AB
Solar Energy, 142, 330, 2017
10 Key issues in development of thermoelectric power generators: High figure-of-merit materials and their highly conducting interfaces with metallic interconnects
Aswal DK, Basu R, Singh A
Energy Conversion and Management, 114, 50, 2016