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Specific contact resistance of IGZO thin film transistors with metallic and transparent conductive oxides electrodes and XPS study of the contact/semiconductor interfaces Rivas-Aguilar ME, Hernandez-Como N, Gutierrez-Heredia G, Sanchez-Martinez A, Ramirez MM, Mejia I, Quevedo-Lopez MA Current Applied Physics, 18(7), 834, 2018 |
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Study on the measurement accuracy of circular transmission line model for low-resistance Ohmic contacts on III-V wide band-gap semiconductors Liu T, Huang R, Li FS, Huang ZL, Zhang J, Liu JP, Zhang LQ, Zhang SM, An DS, Yang H Current Applied Physics, 18(7), 853, 2018 |
3 |
Specific contact resistance of IGZO thin film transistors with metallic and transparent conductive oxides electrodes and XPS study of the contact/semiconductor interfaces Rivas-Aguilar ME, Hernandez-Como N, Gutierrez-Heredia G, Sanchez-Martinez A, Ramirez MM, Mejia I, Quevedo-Lopez MA Current Applied Physics, 18(7), 834, 2018 |
4 |
Study on the measurement accuracy of circular transmission line model for low-resistance Ohmic contacts on III-V wide band-gap semiconductors Liu T, Huang R, Li FS, Huang ZL, Zhang J, Liu JP, Zhang LQ, Zhang SM, An DS, Yang H Current Applied Physics, 18(7), 853, 2018 |
5 |
Specific contact resistance of IGZO thin film transistors with metallic and transparent conductive oxides electrodes and XPS study of the contact/semiconductor interfaces Rivas-Aguilar ME, Hernandez-Como N, Gutierrez-Heredia G, Sanchez-Martinez A, Ramirez MM, Mejia I, Quevedo-Lopez MA Current Applied Physics, 18(7), 834, 2018 |
6 |
Study on the measurement accuracy of circular transmission line model for low-resistance Ohmic contacts on III-V wide band-gap semiconductors Liu T, Huang R, Li FS, Huang ZL, Zhang J, Liu JP, Zhang LQ, Zhang SM, An DS, Yang H Current Applied Physics, 18(7), 853, 2018 |
7 |
High-efficiency, single-crystalline, p- and n-type Si solar cells: Microstructure and chemical analysis of the glass layer Kumar P, Aabdin Z, Pfeffer M, Eibl O Solar Energy Materials and Solar Cells, 178, 52, 2018 |
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Application of CTLM method combining interfacial structure characterization to investigate contact formation of silver paste metallization on crystalline silicon solar cells Xiong SH, Yuan X, Tong H, Yang YX, Liu C, Ye XJ, Li YS, Wang XH, Luo L Solid-State Electronics, 142, 1, 2018 |
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Multi-wire metallization for solar cells: Contact resistivity of the interface between the wires and In2O3:Sn, In2O3:F, and ZnO:Al layers Untila GG, Kost TN, Chebotareva AB Solar Energy, 142, 330, 2017 |
10 |
Key issues in development of thermoelectric power generators: High figure-of-merit materials and their highly conducting interfaces with metallic interconnects Aswal DK, Basu R, Singh A Energy Conversion and Management, 114, 50, 2016 |