| 1 |
Application of NEAT for the simulation of liquid-liquid extraction processes with poorly specified feeds
Jirasek F, Burger J, Hasse H
AIChE Journal, 66(2), 2020 |
| 2 |
Activity and degradation study of an Fe-N-C catalyst for ORR in Direct Methanol Fuel Cell (DMFC)
Martinaiou I, Videla AHAM, Weidler N, Kubler M, Wallace WDZ, Paul S, Wagner S, Shahraei A, Stark RW, Specchia S, Kramm UI
Applied Catalysis B: Environmental, 262, 2020 |
| 3 |
New insight into the support effect on HDS catalysts: evidence for the role of Mo-support interaction on the MoS2 slab morphology
Garcia ED, Chen JJ, Oliviero E, Oliviero L, Mauge F
Applied Catalysis B: Environmental, 260, 2020 |
| 4 |
Influence of Gd+3 incorporation on ethanol sensing properties of Barium Stannate microrod films prepared by coprecipitation method
Bhattacharya A, Chu XF, Gao Q, Li X, Dong YP, Liang SM, Chakraborty AK
Applied Surface Science, 504, 2020 |
| 5 |
Tracing the initial state of surface oxidation in black phosphorus
Oh KH, Jung SW, Kim KS
Applied Surface Science, 504, 2020 |
| 6 |
New interpretation and approach to curve fitting synchrotron X-ray photoelectron spectra of (Fe,Ni)(9)S-8 fracture surfaces
Pettifer ZE, Quinton JS, Skinner WM, Harmer SL
Applied Surface Science, 504, 2020 |
| 7 |
Chemical bonding states and dopant redistribution of heavily phosphorus-doped epitaxial silicon films: Effects of millisecond laser annealing and doping concentration
Ryu HY, Lee M, Park H, Ko DH
Applied Surface Science, 504, 2020 |
| 8 |
Evidence of graphite blister evolution during the anion de-intercalation process in the cathodic regime
Yivlialin R, Brambilla L, Accogli A, Gibertini E, Tommasini M, Goletti C, Leone M, Duo L, Magagnin L, Castiglioni C, Bussetti G
Applied Surface Science, 504, 2020 |
| 9 |
Growth evolution of N-polar indium-rich InAlN layer on c-sapphire via strain relaxation by ultrathin AlON interlayer
Chauhan P, Hasenohrl S, Minj A, Chauvat MP, Ruterana P, Kuzmik J
Applied Surface Science, 502, 2020 |
| 10 |
Structure, binding energy and optoelectrical properties of p-type CuI thin films: The effects of thickness
Peng W, Li LX, Yu SH, Zheng HR, Yang P
Applied Surface Science, 502, 2020 |
