화학공학소재연구정보센터
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No. Article
1 Lamellar diblock copolymer thin films investigated by tapping mode atomic force microscopy: Molar-mass dependence of surface ordering. (vol 36, pg 8717, 2003)
Busch P, Posselt D, Smilgies DM, Rheinlander B, Kremer F, Papadakis CM
Macromolecules, 39(8), 3098, 2006
2 a-Si/SiOx Bragg-reflectors on micro-structured InP
Schmidt-Grund R, Nobis T, Gottschalch V, Rheinlander B, Herrnberger H, Grundmann M
Thin Solid Films, 483(1-2), 257, 2005
3 UV-VUV spectroscopic ellipsometry of ternary MgxZn1-xO (0 <= x <= 0.53) thin films
Schmidt-Grund R, Schubert M, Rheinlander B, Fritsch D, Schmidt H, Kaidashev EM, Lorenz M, Herzinger CM, Grundmann M
Thin Solid Films, 455-56, 500, 2004
4 Lamellar diblock copolymer thin films investigated by tapping mode atomic force microscopy: Molar-mass dependence of surface ordering
Busch P, Posselt D, Smilgies DM, Rheinlander B, Kremer F, Papadakis CM
Macromolecules, 36(23), 8717, 2003
5 Plasma-enhanced chemical vapor deposition of SiOx/SiNx Bragg reflectors
Gottschalch V, Schmidt R, Rheinlander B, Pudis D, Hardt S, Kvietkova J, Wagner G, Franzheld R
Thin Solid Films, 416(1-2), 224, 2002
6 InP monolayers inserted in a GaP matrix studied by spectroscopic ellipsometry
Schmidt H, Rheinlander B, Gottschalch V, Wagner G
Thin Solid Films, 312(1-2), 354, 1998
7 Ellipsometry on monolayer films of InAs and AlAs embedded in GaAs and of InP embedded in GaP
Schmidt H, Rheinlander B, Gottschalch V
Thin Solid Films, 313-314, 590, 1998
8 Ellipsometric studies on semiconductor microcavity IR-detector structures
Rheinlander B, Kovac J, Hecht JD, Borgulova J, Uherek F, Waclawek J, Gottschalch V, Barna P
Thin Solid Films, 313-314, 599, 1998
9 Optical-Properties of Microconfined Liquid-Crystals
Cramer C, Binder H, Schubert M, Rheinlander B, Schmiedel H
Molecular Crystals and Liquid Crystals Science and Technology. Section A. Molecular Crystals and Liquid Crystals, 282, 395, 1996