검색결과 : 9건
No. | Article |
---|---|
1 |
Lamellar diblock copolymer thin films investigated by tapping mode atomic force microscopy: Molar-mass dependence of surface ordering. (vol 36, pg 8717, 2003) Busch P, Posselt D, Smilgies DM, Rheinlander B, Kremer F, Papadakis CM Macromolecules, 39(8), 3098, 2006 |
2 |
a-Si/SiOx Bragg-reflectors on micro-structured InP Schmidt-Grund R, Nobis T, Gottschalch V, Rheinlander B, Herrnberger H, Grundmann M Thin Solid Films, 483(1-2), 257, 2005 |
3 |
UV-VUV spectroscopic ellipsometry of ternary MgxZn1-xO (0 <= x <= 0.53) thin films Schmidt-Grund R, Schubert M, Rheinlander B, Fritsch D, Schmidt H, Kaidashev EM, Lorenz M, Herzinger CM, Grundmann M Thin Solid Films, 455-56, 500, 2004 |
4 |
Lamellar diblock copolymer thin films investigated by tapping mode atomic force microscopy: Molar-mass dependence of surface ordering Busch P, Posselt D, Smilgies DM, Rheinlander B, Kremer F, Papadakis CM Macromolecules, 36(23), 8717, 2003 |
5 |
Plasma-enhanced chemical vapor deposition of SiOx/SiNx Bragg reflectors Gottschalch V, Schmidt R, Rheinlander B, Pudis D, Hardt S, Kvietkova J, Wagner G, Franzheld R Thin Solid Films, 416(1-2), 224, 2002 |
6 |
InP monolayers inserted in a GaP matrix studied by spectroscopic ellipsometry Schmidt H, Rheinlander B, Gottschalch V, Wagner G Thin Solid Films, 312(1-2), 354, 1998 |
7 |
Ellipsometry on monolayer films of InAs and AlAs embedded in GaAs and of InP embedded in GaP Schmidt H, Rheinlander B, Gottschalch V Thin Solid Films, 313-314, 590, 1998 |
8 |
Ellipsometric studies on semiconductor microcavity IR-detector structures Rheinlander B, Kovac J, Hecht JD, Borgulova J, Uherek F, Waclawek J, Gottschalch V, Barna P Thin Solid Films, 313-314, 599, 1998 |
9 |
Optical-Properties of Microconfined Liquid-Crystals Cramer C, Binder H, Schubert M, Rheinlander B, Schmiedel H Molecular Crystals and Liquid Crystals Science and Technology. Section A. Molecular Crystals and Liquid Crystals, 282, 395, 1996 |