화학공학소재연구정보센터
검색결과 : 44건
No. Article
1 Experimental analysis and improvement of the DC method for self-heating estimation
Mori CAB, Agopian PGD, Martino JA
Solid-State Electronics, 159, 171, 2019
2 Study of line-TFET analog performance comparing with other TFET and MOSFET architectures
Agopian PGD, Martino JA, Vandooren A, Rooyackers R, Simoen E, Thean A, Claeys C
Solid-State Electronics, 128, 43, 2017
3 Comparative analysis of the intrinsic voltage gain and unit gain frequency between SOI and bulk FinFETs up to high temperatures
de Oliveira AV, Agopian PGD, Martino JA, Simoen E, Claeys C, Collaert N, Thean A
Solid-State Electronics, 123, 124, 2016
4 Different stress techniques and their efficiency on triple-gate SOI n-MOSFETs
Buuhler RT, Agopian PGD, Collaert N, Simoen E, Claeys C, Martino JA
Solid-State Electronics, 103, 209, 2015
5 Enhanced dynamic threshold voltage UTBB SOI nMOSFETs
Sasaki KRA, Manini MB, Simoen E, Claeys C, Martino JA
Solid-State Electronics, 112, 19, 2015
6 Analog performance of vertical nanowire TFETs as a function of temperature and transport mechanism
Martino MD, Neves F, Agopian PGD, Martino JA, Vandooren A, Rooyackers R, Simoen E, Thean A, Claeys C
Solid-State Electronics, 112, 51, 2015
7 Advantages of different source/drain engineering on scaled UTBOX FDSOI nMOSFETs at high temperature operation
Nicoletti T, dos Santos SD, Martino JA, Aoulaiche M, Veloso A, Jurczak M, Simoen E, Claeys C
Solid-State Electronics, 91, 53, 2014
8 Threshold voltage extraction in Tunnel FETs
Ortiz-Conde A, Garcia-Sanchez FJ, Muci J, Sucre-Gonzalez A, Martino JA, Agopian PGD, Claeys C
Solid-State Electronics, 93, 49, 2014
9 Low-frequency noise assessment in advanced UTBOX SOI nMOSFETs with different gate dielectrics
dos Santos SD, Cretu B, Strobel V, Routoure JM, Carin R, Martino JA, Aoulaiche M, Jurczak M, Simoen E, Claeys C
Solid-State Electronics, 97, 14, 2014
10 Improved retention times in UTBOX nMOSFETs for 1T-DRAM applications
Sasaki KRA, Nicoletti T, Almeida LM, dos Santos SD, Nissimoff A, Aoulaiche M, Simoen E, Claeys C, Martino JA
Solid-State Electronics, 97, 30, 2014