1 |
Modeling drain current of indium zinc oxide thin film transistors prepared by solution deposition technique Qiang L, Liang XC, Cai GS, Pei YL, Yao RH, Wang G Solid-State Electronics, 144, 22, 2018 |
2 |
Extraction method of trap densities for indium zinc oxide thin-film transistors processed by solution method Qiang L, Liang XC, Pei YL, Yao RH, Wang G Thin Solid Films, 649, 51, 2018 |
3 |
Pulsed laser deposition of HfO2 thin films on indium zinc oxide: Band offsets measurements Craciun D, Craciun V Applied Surface Science, 400, 77, 2017 |
4 |
Effect of IZO passivation layer on AgNWs flexible transparent electrode Han GJ, You S, Choi HW, Kim KH Molecular Crystals and Liquid Crystals, 645(1), 255, 2017 |
5 |
Channel scaling and field-effect mobility extraction in amorphous InZnO thin film transistors Lee S, Song Y, Park H, Zaslavsky A, Paine DC Solid-State Electronics, 135, 94, 2017 |
6 |
Nitrogen-doped amorphous oxide semiconductor thin film transistors with double-stacked channel layers Xie HT, Wu Q, Xu L, Zhang L, Liu GC, Dong CY Applied Surface Science, 387, 237, 2016 |
7 |
Effect of time and deposition method on quality of phosphonic acid modifier self-assembled monolayers on indium zinc oxide Sang LZ, Knesting KM, Bulusu A, Sigdel AK, Giordano AJ, Marder SR, Berry JJ, Graham S, Ginger DS, Pemberton JE Applied Surface Science, 389, 190, 2016 |
8 |
Development of transparent conductive indium and fluorine co-doped ZnO thin films: Effect of F concentration and post-annealing temperature Hadri A, Taibi M, Loghmarti M, Nassiri C, Tlemani TS, Mzerd A Thin Solid Films, 601, 7, 2016 |
9 |
Spectroscopic ellipsOmetry study of compound-induced changes in chemical and optical properties of In2O3:Sn-ZnO:Al films Lin KM, Wu SW, Wang SB, Li LY, Sawada Y Thin Solid Films, 618, 107, 2016 |
10 |
High performance solution-deposited bilayer channel indium-zinc-oxide thin film transistors by low-temperature microwave annealing Oh SM, Jo KW, Cho WJ Current Applied Physics, 15, S69, 2015 |