1 |
Imaging by atomic force microscopy of the properties difference of the layers covering the facets created during SIMS analysis Fares B, Gautier B, Albertini D, Mzerd A, Loghmarti M Applied Surface Science, 308, 24, 2014 |
2 |
AFM study of the SIMS beam induced roughness in monocrystalline silicon in presence of initial surface or bulk defects of nanometric size Fares B, Dubois C, Gautier B, Dupuy JC, Cayrel F, Gaudin G Applied Surface Science, 252(19), 6448, 2006 |
3 |
Deconvolution of very low primary energy SIMS depth profiles2w Fares B, Gautier B, Dupuy JC, Prudon G, Holliger P Applied Surface Science, 252(19), 6478, 2006 |
4 |
Surface roughening and erosion rate change at low energy SIMS depth profiling of silicon during oblique O-2(+) bombardment Fares B, Gautier B, Holliger P, Baboux N, Prudon G, Dupuy JC Applied Surface Science, 253(5), 2662, 2006 |
5 |
Imaging by atomic force microscopy of the electrical properties difference of the facets of oxygen-ion-induced ripple topography in silicon Gautier B, Fares B, Prudon G, Dupuy JC Applied Surface Science, 231-2, 136, 2004 |
6 |
Influence of surface orientation on the formation of sputtering-induced ripple topography in silicon Fares B, Gautier B, Baboux N, Prudon G, Holliger P, Dupuy JC Applied Surface Science, 231-2, 678, 2004 |
7 |
Robust control via sequential semidefinite programming Fares B, Noll D, Apkarian P SIAM Journal on Control and Optimization, 40(6), 1791, 2002 |
8 |
An augmented Lagrangian method for a class of LMI-constrained problems in robust control theory Fares B, Apkarian P, Noll D International Journal of Control, 74(4), 348, 2001 |