화학공학소재연구정보센터
검색결과 : 8건
No. Article
1 Imaging by atomic force microscopy of the properties difference of the layers covering the facets created during SIMS analysis
Fares B, Gautier B, Albertini D, Mzerd A, Loghmarti M
Applied Surface Science, 308, 24, 2014
2 AFM study of the SIMS beam induced roughness in monocrystalline silicon in presence of initial surface or bulk defects of nanometric size
Fares B, Dubois C, Gautier B, Dupuy JC, Cayrel F, Gaudin G
Applied Surface Science, 252(19), 6448, 2006
3 Deconvolution of very low primary energy SIMS depth profiles2w
Fares B, Gautier B, Dupuy JC, Prudon G, Holliger P
Applied Surface Science, 252(19), 6478, 2006
4 Surface roughening and erosion rate change at low energy SIMS depth profiling of silicon during oblique O-2(+) bombardment
Fares B, Gautier B, Holliger P, Baboux N, Prudon G, Dupuy JC
Applied Surface Science, 253(5), 2662, 2006
5 Imaging by atomic force microscopy of the electrical properties difference of the facets of oxygen-ion-induced ripple topography in silicon
Gautier B, Fares B, Prudon G, Dupuy JC
Applied Surface Science, 231-2, 136, 2004
6 Influence of surface orientation on the formation of sputtering-induced ripple topography in silicon
Fares B, Gautier B, Baboux N, Prudon G, Holliger P, Dupuy JC
Applied Surface Science, 231-2, 678, 2004
7 Robust control via sequential semidefinite programming
Fares B, Noll D, Apkarian P
SIAM Journal on Control and Optimization, 40(6), 1791, 2002
8 An augmented Lagrangian method for a class of LMI-constrained problems in robust control theory
Fares B, Apkarian P, Noll D
International Journal of Control, 74(4), 348, 2001