TY - JOUR PY - 2011 J2 - Appl. Surf. Sci. SN - 0169-4332 T2 - Applied Surface Science VL - 257 IS - 17 DO - 10.1016/j.apsusc.2011.03.015 TI - Composition depth profiles of Bi3.15Nd0.85Ti3O12 thin films studied by X-ray photoelectron spectroscopy UR - https://www.cheric.org/research/tech/periodicals/view.php?seq=902893 KW - X-ray photoelectron spectroscopy KW - Ferroelectric thin film KW - Composition depth profiles KW - Chemical solution deposition AU - Zhang ZH AU - Zhong XL AU - Liao H AU - Wang F AU - Wang JB AU - Zhou YC SP - 7461 EP - 7465 LA - English ER -