TY - JOUR PY - 2003 J2 - Appl. Surf. Sci. SN - 0169-4332 T2 - Applied Surface Science VL - 214 IS - 1-4 DO - 10.1016/S0169-4332(03)00269-1 TI - Optical and dielectric properties of highly oriented (Zr-0.8,Sn-0.2)TiO4 thin films prepared by rf magnetron sputtering UR - https://www.cheric.org/research/tech/periodicals/view.php?seq=639676 KW - (Zr-0.2,Sn-0.8)TiO4 (ZST) thin film KW - rf sputtering KW - optical properties KW - dielectric properties AU - Cheng WX AU - Ding AL AU - Qiu PS AU - He XY AU - Zheng XSH SP - 136 EP - 142 LA - English ER -