TY - JOUR PY - 2001 J2 - Appl. Surf. Sci. SN - 0169-4332 T2 - Applied Surface Science VL - 181 IS - 1-2 DO - 10.1016/S0169-4332(01)00378-6 TI - Dielectric relaxation in polycrystalline thin films of In2Te3 UR - https://www.cheric.org/research/tech/periodicals/view.php?seq=637795 KW - thin films KW - relaxation time measurements KW - AC conductivity KW - In2Te3 KW - dielectric measurements KW - semiconductors AU - Seyam MAM SP - 128 EP - 138 LA - English ER -