TY - JOUR PY - 2000 J2 - Rev. Chem. Eng. SN - 0167-8299 T2 - Reviews in Chemical Engineering VL - 16 IS - 4 TI - Applications of X-ray photoelectron spectroscopy and static secondary ion mass spectrometry in surface characterization of copolymers and polymers blends UR - https://www.cheric.org/research/tech/periodicals/view.php?seq=291600 AU - Chan CM AU - Weng LT SP - 341 EP - 408 LA - English ER -