TY - JOUR PY - 2019 J2 - Energy SN - 0360-5442 T2 - Energy VL - 174 DO - 10.1016/j.energy.2019.02.170 TI - Diagnosis of GaAs solar-cell resistance via absolute electroluminescence imaging and distributed circuit modeling UR - https://www.cheric.org/research/tech/periodicals/view.php?seq=1722876 KW - Absolute electroluminescence KW - Imaging KW - Solar cell KW - Defect KW - Distributed circuit AU - Hu XB AU - Chen TF AU - Hong JY AU - Chen SQ AU - Weng GE AU - Zhu ZQ AU - Chu JH SP - 85 EP - 90 LA - English ER -