TY - JOUR PY - 2019 J2 - Thin Solid Films SN - 0040-6090 T2 - Thin Solid Films VL - 673 DO - 10.1016/j.tsf.2019.01.022 TI - Comparison study of temperature dependent direct/indirect bandgap emissions of Ge1-x-ySixSny and Ge1-ySny grown on Ge buffered Si UR - https://www.cheric.org/research/tech/periodicals/view.php?seq=1716163 KW - Photoluminescence KW - Direct/indirect bandgap emissions KW - Germanium tin KW - Germanium silicon tin KW - Strain KW - Valence band splitting AU - Wang BG AU - Harris TR AU - Hogsed MR AU - Yeo YK AU - Ryu MY AU - Kouvetakis J SP - 63 EP - 71 LA - Multi-Language ER -