TY - JOUR PY - 2018 J2 - Thin Solid Films SN - 0040-6090 T2 - Thin Solid Films VL - 663 DO - 10.1016/j.tsf.2018.08.008 TI - Crack-free GaN-based ultraviolet multiple quantum wells structures grown on AlN/2 degrees misoriented sapphire template UR - https://www.cheric.org/research/tech/periodicals/view.php?seq=1685908 KW - Gallium nitride KW - Indium gallium nitride KW - Multiple quantum wells KW - Aluminum nitride template KW - Crack-free KW - Optical property KW - Crystalline quality AU - Fan XM AU - Bai JC AU - Xu SR AU - Zhang JC AU - Li PX AU - Peng RS AU - Zhao Y AU - Du JJ AU - Shi XF AU - Hao Y SP - 44 EP - 48 LA - Multi-Language ER -