TY - JOUR PY - 2011 J2 - Thin Solid Films SN - 0040-6090 T2 - Thin Solid Films VL - 519 IS - 7 DO - 10.1016/j.tsf.2010.10.059 TI - Influence of the surface roughness on the properties of Au films measured by surface plasmon resonance and X-ray reflectometry UR - https://www.cheric.org/research/tech/periodicals/view.php?seq=1064440 KW - Surface plasmon resonance KW - X-ray reflectometry KW - Gold KW - Thin films KW - Optical properties KW - Evaporation AU - Velinov T AU - Ahtapodov L AU - Nelson A AU - Gateshki M AU - Bivolarska M SP - 2093 EP - 2097 LA - Multi-Language ER -