Growth of yttria partially and fully stabilized zirconia crystals by xenon arc image floating zone method

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Abstract

Single crystals of yttria partially stabilized and yttria fully stabilized zirconia with the composition YxZr1−xO2−x/2 (x = 0.02-0.30) were grown from the melt by xenon arc image floating zone method. The crystals are 3–4 mm in diameter and 150 mm in length. Crystals with low yttria content tended to bend or develop cracks on cooling and those with high yttria content were straight and had no cracks. The microstructures of the crystals were analysed by TEM, SEM and XRD. Chemical etching of the crystal with hot phospheric acid preferentially dissolved the matrix phase in comparison with the precipitate phase. The SEM photographs of the etched surface showed microstructural images closely related to those observed by TEM.

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